Materials Characterization and Analysis Techniques
- General components of analytical instruments: probe, signal, separator, detector, and display
- Optical emission spectroscopy methods for elemental analysis
- Optical absorption spectroscopy methods for elemental analysis
- X-ray generation and X-ray fluorescence spectroscopy for elemental analysis
- The interaction of X-rays with repeating structures and how it is used to analyze crystal structures
- Electron diffraction
- Principles of microscopy, concepts of magnification, resolution, depth of field, topography
- Introduction to types of transmission and reflection, optical, and scanning probe microscopes
- Introduction to Transmission Electron Microscopy
- Transmission Electron Microscopy Sample Preparation
- Electron interactions with the sample
- Introduction to Scanning Electron Microscopy
- Scanning Electron Microscopy Sample Preparation
- Introduction to Scanning probe microscopy
- Brief overview of other analytical methods: thermal analysis, particle analysis, surface analysis, ellipsometry, and molecular analysis
- Wet chemistry