(Testing and Testable System Design)
- Introduction to Testing, Role of Testing in Digital System Design and Implementation, Types of Testing
- Automatic Test Equipments, Test Economics and Production Quality
- Yield, Defect Level and Role of Testing in Yield and Defect Level
- Fault Modeling in Digital System Design
- Logic Simulation, Fault Simulation and Their Methods
- Fault Simulation Algorithms: Serial, Parallel and Deductive
- Concurrent Fault Simulation, Fault Sampling
- Testability Measures, SCOAP Controllability and Obvervability estimation for Combinational and Sequential Circuits
- Automatic Test Pattern Generation, Functional Testing vs. Structural Testing
- Redundancy Removal using Test Pattern Generation, Combinational Test Pattern Generation Algorithm (D, PODEM, FAN)
- Sequential-Circuit Test Pattern Generation Algorithm
- Adhoc Methods in Testable Design
- Scan Design and Partial Scan Design
- Built-In Self-Test, Random Test Pattern Generators
- Test Response Compaction
- Boundary Scan Design, TAP Controller, Boundary Scan Design Language